A combined synthetic and np scheme for detecting increases in fraction nonconforming
Khoo, Michael B. C.
Date of Issue2011
School of Mechanical and Aerospace Engineering
The applications of attribute control charts cover a wide variety of manufacturing processes in which quality characteristics cannot be measured on a continuous numerical scale or even a quantitative scale. The np control chart is an attribute chart used to monitor the fraction nonconforming p of a process. This chart is effective for detecting large process shifts in p. The attribute synthetic chart is also proposed to detect p shifts. It utilizes the information about the time interval or the Conforming Run Length (CRL) between two nonconforming samples. During the implementation of a synthetic chart, a sample is classified as nonconforming if the number d of nonconforming units falls beyond a warning limit. Unlike the np chart, the synthetic chart is more powerful to detect small and moderate p shifts. This article proposes a new scheme, the Syn-np chart, which comprises a synthetic chart and an np chart. Since the Syn-np chart has both the strength of the synthetic chart for quickly detecting small p shifts and the advantage of the np chart of being sensitive to large p shifts, it has a better and more uniform overall performance. Specifically, it is more effective than the np chart and synthetic chart by 73% and 31%, respectively, in terms of Weighted Average of Average Time to Signal (WAATS) over a wide range of p shifts under different conditions.
Computers & industrial engineering