dc.contributor.authorHaridy, Salah
dc.contributor.authorWu, Zhang
dc.contributor.authorKhoo, Michael B. C.
dc.contributor.authorYu, Fong-Jung
dc.identifier.citationHaridy, S., Wu, Z., Khoo, M. B.,& Yu, F. J. (2012). A combined synthetic and np scheme for detecting increases in fraction nonconforming. Computers & Industrial Engineering, 62(4), 979-988.en_US
dc.description.abstractThe applications of attribute control charts cover a wide variety of manufacturing processes in which quality characteristics cannot be measured on a continuous numerical scale or even a quantitative scale. The np control chart is an attribute chart used to monitor the fraction nonconforming p of a process. This chart is effective for detecting large process shifts in p. The attribute synthetic chart is also proposed to detect p shifts. It utilizes the information about the time interval or the Conforming Run Length (CRL) between two nonconforming samples. During the implementation of a synthetic chart, a sample is classified as nonconforming if the number d of nonconforming units falls beyond a warning limit. Unlike the np chart, the synthetic chart is more powerful to detect small and moderate p shifts. This article proposes a new scheme, the Syn-np chart, which comprises a synthetic chart and an np chart. Since the Syn-np chart has both the strength of the synthetic chart for quickly detecting small p shifts and the advantage of the np chart of being sensitive to large p shifts, it has a better and more uniform overall performance. Specifically, it is more effective than the np chart and synthetic chart by 73% and 31%, respectively, in terms of Weighted Average of Average Time to Signal (WAATS) over a wide range of p shifts under different conditions.en_US
dc.relation.ispartofseriesComputers & industrial engineeringen_US
dc.titleA combined synthetic and np scheme for detecting increases in fraction nonconformingen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen_US

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