dc.contributor.authorGuo, Wenjiang
dc.contributor.authorZhao, Liping
dc.contributor.authorChen, I-Ming
dc.date.accessioned2013-09-06T02:46:27Z
dc.date.available2013-09-06T02:46:27Z
dc.date.copyright2013en_US
dc.date.issued2013
dc.identifier.citationGuo, W., Zhao, L., & Chen, I.-M. (2013). Toroidal surface measurement with elliptical lenslet array. Proceeding of SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87690A.en_US
dc.identifier.urihttp://hdl.handle.net/10220/13351
dc.description.abstractToroidal surfaces have wide applications in optics and manufacturing industry. Due to the strong aspherical surface profile of a toroidal surface, there are few optical measurement techniques proposed or reported for its measurement. This paper proposed digital Shack Hartmann wavefront sensor (SHWS) with extendable dynamic range. Instead of the traditional spherical lenslet array, which cannot sample the wavefront in two directions simultaneously, an elliptical lenslet array realized by a spatial light modulator (SLM), which provides different optical powers in two directions, is used in the system. With the incorporation of the extended version of the traditional SHWS, the reference-free wavefront sensor (RFWS), curvature matrix is measured, which can be further reconstructed into the surface profile. Both numerical simulation and experimental study has been conducted and the feasibility of measuring toroidal surfaces in the RFWS system with an elliptical lenslet array is proven.en_US
dc.language.isoenen_US
dc.rights© 2013 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) and is made available as an electronic reprint (preprint) with permission of SPIE. The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/12.2021097].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en_US
dc.titleToroidal surface measurement with elliptical lenslet arrayen_US
dc.typeConference Paper
dc.contributor.conferenceInternational Conference on Optics in Precision Engineering and Nanotechnology (2013 : Singapore)en_US
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1117/12.2021097
dc.description.versionPublished versionen_US


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