dc.contributor.authorYong, Derrick
dc.contributor.authorYu, Xia
dc.contributor.authorRen, Guobin
dc.contributor.authorZhang, Huiyu
dc.contributor.authorZhang, Ying
dc.contributor.authorChan, Chi Chiu
dc.contributor.authorWei, Huifeng
dc.contributor.authorTong, Weijun
dc.date.accessioned2013-09-13T01:30:51Z
dc.date.available2013-09-13T01:30:51Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.issn1077-260Xen_US
dc.identifier.urihttp://hdl.handle.net/10220/13438
dc.description.abstractWe report a novel photonic bandgap sensor, comprising a D-shaped fiber fabricated via side polishing. It takes advantage of measurand-elicited refractive-index profile changes upon exposure of its side-polished region to an ambient liquid. The bandgap shift can be induced by perturbations in close proximity to the fiber core, such as the change of refractive index in the surrounding. The side-polished all-solid photonic bandgap fiber utilized offers an infiltration-free sensing mechanism, which eliminates difficult air-hole infiltration and evacuation processes experienced by most photonic crystal fiber-based index sensors. Experimental results demonstrated the repeatability and linearity in refractive-index sensing from 1.31 to 1.43 with a sensitivity of 10 -5 refractive-index units (RIUs). Additional study was also conducted to identify the significance of polishing depths in relation to the sensor performance.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesIEEE journal of selected topics in quantum electronicsen_US
dc.rights© 2012 IEEEen_US
dc.titlePhotonic bandgap fiber for infiltration-free refractive-index sensingen_US
dc.typeJournal Article
dc.contributor.researchSingapore Institute of Manufacturing Technologyen_US
dc.contributor.schoolSchool of Chemical and Biomedical Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/JSTQE.2011.2179526


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