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|Title:||A 5.61 pJ, 16 kb 9T SRAM with single-ended equalized bitlines and fast local write-back for cell stability improvement||Authors:||Li, Qi
Kim, Tony Tae-Hyoung
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering||Issue Date:||2012||Source:||Li, Q., Wang, B., & Kim, T. T. (2012). A 5.61 pJ, 16 kb 9T SRAM with single-ended equalized bitlines and fast local write-back for cell stability improvement. ESSDERC 2012 - 42nd European Solid State Device Research Conference, pp.201-204.||Abstract:||A 5.61 pJ, 16 kb 9T SRAM is implemented in 65nm CMOS technology. A single-ended equalized bitline scheme is proposed to improve both read bitline voltage swing and sensing timing window. A fast local write-back allows the half-select-free write operation without performance degradation. The test chip shows a minimum operating voltage of 0.24V and a minimum energy of 5.61pJ at 0.3V.||URI:||https://hdl.handle.net/10356/99838
|Appears in Collections:||EEE Conference Papers|
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