dc.contributor.authorDo, Anh Tuan
dc.contributor.authorTan, Yung Sern
dc.contributor.authorXiong, Gordon M.
dc.contributor.authorChoong, Cleo Swee Neo
dc.contributor.authorKong, Zhi Hui
dc.contributor.authorYeo, Kiat Seng
dc.date.accessioned2013-10-21T03:31:36Z
dc.date.available2013-10-21T03:31:36Z
dc.date.copyright2013en_US
dc.date.issued2013
dc.identifier.citationDo, A. T., Tan, Y. S., Xiong, G. M., Choong, C. S. N., Kong, Z. H., & Yeo, K. S. (2013).A current-mode stimulator circuit with two-step charge balancing background calibration . 2013 IEEE International Symposium on Circuits and Systems (ISCAS).en_US
dc.identifier.urihttp://hdl.handle.net/10220/16638
dc.description.abstractCurrent-mode CMOS stimulation systems have offered unprecedented opportunities for accurate and high through put in-vitro and in-vivo physiological studies. As these circuits are in long term contact with living organisms, they must be flexible, safe and power efficient. Any mismatch in biphasic current pulses will result in charge imbalance, leading to tissue/cell damage. Therefore, it is the most important to maintain the balance of the charge injected and retracted by the anode and the cathode, respectively. This work first adjusts the body biasing voltage of the anode to match with the cathode current. It is robust, process-variation-aware and can reduce the imbalanced current to less than 1%. Second, any residue charge at the stimulation site is retracted only when it reaches a critical value. This process is performed in the background and thus does not disturb the front-end operation. Overall, it can achieve less than 0.4 nA DC error current and thus is a suitable candidate for long term stimulation applications.en_US
dc.language.isoenen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering
dc.titleA current-mode stimulator circuit with two-step charge balancing background calibrationen_US
dc.typeConference Paper
dc.contributor.conferenceIEEE International Symposium on Circuits and Systems (2013 : Beijing, China)en_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/ISCAS.2013.6571867


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