dc.contributor.authorJerez, J. L.
dc.contributor.authorLing, Keck Voon
dc.contributor.authorConstantinides, George A.
dc.contributor.authorKerrigan, E. C.
dc.date.accessioned2013-10-21T08:03:36Z
dc.date.available2013-10-21T08:03:36Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.citationJerez, J. L., Ling, K. V., Constantinides, G. A., & Kerrigan, E. C. (2012). Model predictive control for deeply pipelined field-programmable gate array implementation : algorithms and circuitry. IET control theory & applications, 6(8), 1029-1041.en_US
dc.identifier.issn1751-8644en_US
dc.identifier.urihttp://hdl.handle.net/10220/16665
dc.description.abstractModel predictive control (MPC) is an optimisation-based scheme that imposes a real-time constraint on computing the solution of a quadratic programming (QP) problem. The implementation of MPC in fast embedded systems presents new technological challenges. In this paper we present a parameterised field-programmable gate array implementation of a customised QP solver for optimal control of linear processes with constraints, which can achieve substantial acceleration over a general purpose microprocessor, especially as the size of the optimisation problem grows. The focus is on exploiting the structure and accelerating the computational bottleneck in a primal-dual interior-point method. We then introduce a new MPC formulation that can take advantage of the novel computational opportunities, in the form of parallel computational channels, offered by the proposed pipelined architecture to improve performance even further. This highlights the importance of the interaction between the control theory and digital system design communities for the success of MPC in fast embedded systems.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesIET control theory & applicationsen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering
dc.titleModel predictive control for deeply pipelined field-programmable gate array implementation : algorithms and circuitryen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1049/iet-cta.2010.0441


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