dc.contributor.authorLiu, Xin
dc.contributor.authorDatta, Anwitaman
dc.contributor.authorFang, Hui
dc.contributor.authorZhang, Jie
dc.date.accessioned2013-10-24T06:35:56Z
dc.date.available2013-10-24T06:35:56Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.citationLiu, X., Datta, A., Fang, H., & Zhang, J. (2012). Detecting imprudence of 'reliable' sellers in online auction sites. 2012 IEEE 11th International Conference on Trust, Security and Privacy in Computing and Communications (TrustCom), pp.246-253.en_US
dc.identifier.urihttp://hdl.handle.net/10220/16771
dc.description.abstractReputation systems deployed in popular online auction sites simply aggregate feedback about a seller's past transactions. By studying a real auction site dataset, we infer that a non-negligible fraction of unsatisfactory transactions involve sellers with high reputation. Such a phenomenon can be interpreted by motivation theory from behaviorial science: A seller with high reputation has more business opportunities. Bad feedback for latest transactions do not immediately affect his reputation adequately to hurt business, hence he may not be as prudent as before. In this work, we propose the concept of imprudence to study and detect the inappropriate behavior of a 'reliable' seller (i.e., the one with high reputation computed using conventional approaches). Specifically, we first identify and verify the features that influence a seller's imprudence behavior. We then design a novel intelligent buying agent to combine these factors using logistic regression for predicting and studying the probability of imprudence of a target seller. We validate our approach using real datasets driven experiments.en_US
dc.language.isoenen_US
dc.subjectDRNTU::Engineering::Computer science and engineering
dc.titleDetecting imprudence of 'reliable' sellers in online auction sitesen_US
dc.typeConference Paper
dc.contributor.conferenceIEEE International Conference on Trust, Security and Privacy in Computing and Communications (11th : 2012 : Liverpool, UK)en_US
dc.contributor.schoolSchool of Computer Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/TrustCom.2012.123


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