dc.contributor.authorHuang, Likun
dc.contributor.authorLu, Jiwen
dc.contributor.authorYang, Gao
dc.contributor.authorTan, Yap Peng
dc.date.accessioned2013-10-25T01:58:13Z
dc.date.available2013-10-25T01:58:13Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.citationHuang, L., Lu, J., Yang, G., & Tan, Y. P. (2012). Generalized subspace disance for set-to-set image classification. 2012 IEEE International Symposium on Circuits and Systems(ISCAS), pp.1123-1126.en_US
dc.identifier.urihttp://hdl.handle.net/10220/16873
dc.description.abstractRecent research in visual data classification often involves image sets and the measurement of dissimilarity between each pair of them. An effective solution is to model each image set using a subspace and compute the distance between these two subspaces as the dissimilarity between the sets. Several subspace similarity measures have been proposed in the literature. However, their relationships have not been well explored and most of them do not fully utilize the different importance of individual bases of each subspace. To consolidate this family of subspace-based measures, we propose a generalized subspace distance (GSD) framework and show that most existing subspace similarity measures can be considered as its special cases. To better utilize the different importance, we further propose a new fractional order weighted subspace distance (FOWSD) method within the GSD framework, by assigning different weights to the bases of each subspace and thus characterizing their different importance in similarity measurement. Experimental results on two image classification tasks including face recognition and object recognition are presented to show the effectiveness of the proposed method.en_US
dc.language.isoenen_US
dc.rights© 2012 IEEEen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering
dc.titleGeneralized subspace disance for set-to-set image classificationen_US
dc.typeConference Paper
dc.contributor.conferenceIEEE International Symposium on Circuits and Systems (2012 : Seoul, Korea)en_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/ISCAS.2012.6271428


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