Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/100601
Title: Randomized spatial partition for scene recognition
Authors: Jiang, Yuning
Yuan, Junsong
Yu, Gang
Keywords: DRNTU::Engineering::Computer science and engineering::Computing methodologies::Pattern recognition
Issue Date: 2012
Source: Jiang, Y., Yuan, J., & Yu, G. (2012). Randomized Spatial Partition for Scene Recognition. Proceedings of the 12th European conference on Computer Vision (ECCV12), pp.730-743.
Abstract: The spatial layout of images plays a critical role in natural scene analysis. Despite previous work, e.g., spatial pyramid matching, how to design optimal spatial layout for scene classification remains an open problem due to the large variations of scene categories. This paper presents a novel image representation method, with the objective to characterize the image layout by various patterns, in the form of randomized spatial partition (RSP). The RSP-based image representation makes it possible to mine the most descriptive image layout pattern for each category of scenes, and then combine them by training a discriminative classifier, i.e., the proposed ORSP classifier. Besides RSP image representation, another powerful classifier, called the BRSP classifier, is also proposed. By weighting a sequence of various partition patterns via boosting, the BRSP classifier is more robust to the intra-class variations hence leads to a more accurate classification. Both RSP-based classifiers are tested on three publicly available scene datasets. The experimental results highlight the effectiveness of the proposed methods.
URI: https://hdl.handle.net/10356/100601
http://hdl.handle.net/10220/17891
DOI: http://dx.doi.org/10.1007/978-3-642-33709-3_52
Rights: © 2012 Springer-Verlag Berlin Heidelberg. This is the author created version of a work that has been peer reviewed and accepted for publication by Proceedings of the 12th European conference on Computer Vision (ECCV12), Springer-Verlag Berlin Heidelberg. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1007/978-3-642-33709-3_52].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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