Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/100453
Title: Fast face detection and localization from multi-views using statistical approach
Authors: Teoh, Eam Khwang
Anvar, Seyed Mohammad Hassan
Yau, Wei-Yun
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2011
Source: Anvar, S. M. H., Yau, W., & Teoh, E. K. (2011). Fast face detection and localization from multi-views using statistical approach. International Conference on Information, Communications & Signal Processing, 1-5.
Abstract: Window-based face detection methods are fast. However their results are coarse, pose dependent and require fine face alignment for face analysis. Recently a statistical approach is introduced by Toews and Arbel [1], which is able to detect faces in multiple poses and does not require face alignment. However, their method is slow compared to the window-based method. In this paper, we proposed a method, which capable of detecting faces in multiple poses in near real time and also does not require face alignment. Experimental results show that our proposed method has comparable accuracy with the Toews and Arbel’s method but has significantly lower processing time.
URI: https://hdl.handle.net/10356/100453
http://hdl.handle.net/10220/17901
DOI: 10.1109/ICICS.2011.6173610
Rights: © 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/ICICS.2011.6173610].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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