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|Title:||Fast face detection and localization from multi-views using statistical approach||Authors:||Teoh, Eam Khwang
Anvar, Seyed Mohammad Hassan
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering||Issue Date:||2011||Source:||Anvar, S. M. H., Yau, W., & Teoh, E. K. (2011). Fast face detection and localization from multi-views using statistical approach. International Conference on Information, Communications & Signal Processing, 1-5.||Abstract:||Window-based face detection methods are fast. However their results are coarse, pose dependent and require fine face alignment for face analysis. Recently a statistical approach is introduced by Toews and Arbel , which is able to detect faces in multiple poses and does not require face alignment. However, their method is slow compared to the window-based method. In this paper, we proposed a method, which capable of detecting faces in multiple poses in near real time and also does not require face alignment. Experimental results show that our proposed method has comparable accuracy with the Toews and Arbel’s method but has significantly lower processing time.||URI:||https://hdl.handle.net/10356/100453
|DOI:||http://dx.doi.org/10.1109/ICICS.2011.6173610||Rights:||© 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/ICICS.2011.6173610].||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Conference Papers|
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