dc.contributor.authorSim, K. S.
dc.contributor.authorNia, M. E.
dc.contributor.authorTso, Chih Ping.
dc.contributor.authorLIM, W.K.
dc.date.accessioned2013-12-05T03:49:12Z
dc.date.available2013-12-05T03:49:12Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.citationSim, K. S., Nia, M. E., Tso, C. P., & LIM, W. K. (2012). Performance of new signal-to-noise ratio estimation for SEM images based on single image noise cross-correlation. Journal of microscopy, 248(2), 120-128.en_US
dc.identifier.issn0022-2720en_US
dc.identifier.urihttp://hdl.handle.net/10220/18084
dc.description.abstractA new technique for estimation of signal-to-noise ratio in scanning electron microscope images is reported. The method is based on the image noise cross-correlation estimation model recently developed. We derive the basic performance limits on a single image signal-to-noise ratio estimation using the Cramer–Rao inequality. The results are compared with those from existing estimation methods including the nearest neighbourhood (the simple method), the first order linear interpolator, and the autoregressive based estimator. The comparisons were made using several tests involving different images within the performance bounds. From the results obtained, the efficiency and accuracy of image noise cross-correlation estimation technique is considerably better than the other three methods.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesJournal of microscopyen_US
dc.subjectDRNTU::Engineering::Mechanical engineering
dc.titlePerformance of new signal-to-noise ratio estimation for SEM images based on single image noise cross-correlationen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1111/j.1365-2818.2012.03657.x


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