dc.contributor.authorZuo, Chao
dc.contributor.authorChen, Qian
dc.contributor.authorQu, Weijuan
dc.contributor.authorAsundi, Anand Krishna
dc.identifier.citationZuo, C., Chen, Q., Qu, W., & Asundi, A. K. (2013). Noninterferometric single-shot quantitative phase microscopy. Optics letters, 38(18), 3538-3541.en_US
dc.description.abstractWe present a noninterferometric single-shot quantitative phase microscopy technique with the use of the transport of intensity equation (TIE). The optical configuration is based on a Michelson-like architecture attached to a nonmodified inverted transmission bright field microscope. Two laterally separated images from different focal planes can be obtained simultaneously by a single camera exposure, enabling the TIE phase recovery to be performed at frame rates that are only camera limited. Precise measurement of a microlens array validates the principle and demonstrates the accuracy of the method. Investigations of chemical-induced apoptosis and the phagocytosis process of macrophages are then presented, suggesting that the method developed can provide promising applications in the dynamic study of cellular processes.en_US
dc.relation.ispartofseriesOptics lettersen_US
dc.rights© 2013 Optical Society of America. This paper was published in Optics Letters and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: http://dx.doi.org/10.1364/OL.38.003538.  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en_US
dc.subjectDRNTU::Engineering::Mechanical engineering
dc.titleNoninterferometric single-shot quantitative phase microscopyen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen_US
dc.description.versionPublished versionen_US

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