Detection of microscope-excited surface plasmon polaritons with Rayleigh scattering from metal nanoparticles
Date of Issue2013
School of Electrical and Electronic Engineering
We propose a mapping tool of surface plasmon polaritons (SPPs) excited using an optical microscope. By combining dark-field and confocal microscopy, we can efficiently extract metal nanoparticle-induced Rayleigh scattering from background radiation, thereby leading to state-of-the-art SPP measurements. The method is verified to be sensitive to the dominant perpendicular field component of SPPs and be of high accuracy. We also use this method to reveal the conversion of spin angular momentum of light to the orbital angular momentum of SPPs under tight-focusing conditions.
Applied physics letters
© 2013 AIP Publishing LLC. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of AIP Publishing LLC. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.4827264]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.