Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/101565
Title: Measurement errors induced by retardance deviation in a rotatable retarder fixed polarizer Stokes polarimeter
Authors: Dong, Hui
Shum, Ping
Gong, Yandong
Sun, Qizhen
Keywords: Electrical and Electronic Engineering
Issue Date: 2012
Source: Dong, H., Shum, P., Gong, Y., & Sun, Q. Measurement errors induced by retardance deviation in a rotatable retarder fixed polarizer Stokes polarimeter. Optical Engineering, 51(3), 033001.
Series/Report no.: Optical engineering
Abstract: The retardance of an achromatic retarder may vary in the working frequency range and therefore deviate from its nominal value. In a rotatable retarder and fixed polarizer (RRFP) Stokes polarimeter, the retardance deviation of the retarder will result in significant measurement errors of the Stokes vector. The relationship between the retardance error and the measurement errors is theoretically derived in a RRFP Stokes polarimeter. Theoretical results show that the resultant measurement errors of the Stokes vector are determined by the retardance of the retarder, the retardance error and the Stokes vector under test, but are independent of the angular orientations of the retarder and the intensity measurements. Such measurement errors can not be reduced by choosing a set of optimum angular orientations or increasing the measurement number. To suppress such measurement errors in a complete RRFP Stokes polarimeter, the retarder with retardance from 110-deg to 135-deg is recommended. Simulation results in two measurement scenarios confirm the validity of the theoretical findings.
URI: https://hdl.handle.net/10356/101565
http://hdl.handle.net/10220/18694
ISSN: 0091-3286
DOI: http://dx.doi.org/10.1117/1.OE.51.3.033001
Rights: © 2012 Society of Photo-Optical Instrumentation Engineers. his paper was published in Optical Engineering nd is made available as an electronic reprint (preprint) with permission of Society of Photo-Optical Instrumentation Engineers. The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/1.OE.51.3.033001].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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