dc.contributor.authorChin, Xin Yu
dc.contributor.authorYin, Jun
dc.contributor.authorWang, Zilong
dc.contributor.authorCaironi, Mario
dc.contributor.authorSoci, Cesare
dc.date.accessioned2014-03-26T04:08:11Z
dc.date.available2014-03-26T04:08:11Z
dc.date.copyright2014en_US
dc.date.issued2014
dc.identifier.citationChin, X. Y., Yin, J., Wang, Z., Caironi, M., & Soci, C. (2014). Mapping polarons in polymer FETs by charge modulation microscopy in the mid-infrared. Scientific Reports, 4, 3626-.en_US
dc.identifier.issn2045-2322en_US
dc.identifier.urihttp://hdl.handle.net/10220/18976
dc.description.abstractWe implemented spatial mapping of charge carrier density in the channel of a conventional polymer Field-Effect Transistor (FET) by mid-infrared Charge Modulation Spectroscopy (CMS). CMS spectra are recorded with a high sensitivity confocal Fourier Transform Infra-Red (FTIR) microscope by probing electroinduced Infra-Red Active Vibrational (IRAV) modes and low-energy polaron bands in the spectral region 680–4000 cm−1. Thanks to the high specificity and strong oscillator strength of these modes, charge-induced reflectance measurements allow quantitative estimation of charge carrier densities within the FET channel, without the need for amplitude or phase modulation. This is illustrated by identifying the contribution of intrinsic and electrostatically induced polarons to conduction, and by mapping the polaron spatial distribution in a P3HT (Poly(3-hexylthiophene-2,5-diyl)) FET channel under different drain-source bias conditions. This work demonstrates the potential of mid-infrared charge modulation microscopy to characterize carrier injection and transport in semiconducting polymer materials.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesScientific reportsen_US
dc.rights© 2014 Nature Publishing Group. This paper was published in Scientific Reports and is made available as an electronic reprint (preprint) with permission of Nature Publishing Group. The paper can be found at the following official DOI: [http://dx.doi.org/10.1038/srep03626]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en_US
dc.subjectDRNTU::Engineering::Computer science and engineering
dc.titleMapping polarons in polymer FETs by charge modulation microscopy in the mid-infrareden_US
dc.typeJournal Article
dc.contributor.schoolSchool of Physical and Mathematical Sciencesen_US
dc.identifier.doihttp://dx.doi.org/10.1038/srep03626
dc.description.versionPublished versionen_US


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