Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/102398
Title: Focused ion beam nanoscale patterned transmission-enhanced fiber-optic tips
Authors: Wang, Houxiao
Zhou, Wei
Cui, Ying
Wang, Guanghui
Shum, Perry Ping
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2013
Source: Wang, H., Zhou, W., Cui, Y., Wang, G., & Shum, P. P. (2013). Focused ion beam nanoscale patterned transmission-enhanced fiber-optic tips. Journal of Nanoscience and Nanotechnology, 13(7), 4581-4586.
Series/Report no.: Journal of nanoscience and nanotechnology
Abstract: The angled and tapered antireflection and transmission-enhanced fiber-optic tips were designed, fabricated, and characterized based on nanoscale surface modification using the nano-precision focused ion beam (FIB). The developed optical fiber tips showed combined functions of antireflection and transmission enhancement for higher detection efficiency or signal-to-noise ratio because the FIB-milled nanoholes into the fiber tip endfaces could act as tapered air-filled nanopillars, changing the light propagation direction, enhancing the scattering effect, and allowing more photons to transmit along/near the glass/air interface to enhance the local evanescent field for sensing/detection.
URI: https://hdl.handle.net/10356/102398
http://hdl.handle.net/10220/19005
ISSN: 1533-4880
DOI: http://dx.doi.org/10.1166/jnn.2013.6698
Rights: © 2013 American Scientific Publishers.
metadata.item.grantfulltext: none
metadata.item.fulltext: No Fulltext
Appears in Collections:EEE Journal Articles
MAE Journal Articles

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