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|Title:||Focused ion beam nanoscale patterned transmission-enhanced fiber-optic tips||Authors:||Wang, Houxiao
Shum, Perry Ping
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering||Issue Date:||2013||Source:||Wang, H., Zhou, W., Cui, Y., Wang, G., & Shum, P. P. (2013). Focused ion beam nanoscale patterned transmission-enhanced fiber-optic tips. Journal of Nanoscience and Nanotechnology, 13(7), 4581-4586.||Series/Report no.:||Journal of nanoscience and nanotechnology||Abstract:||The angled and tapered antireflection and transmission-enhanced fiber-optic tips were designed, fabricated, and characterized based on nanoscale surface modification using the nano-precision focused ion beam (FIB). The developed optical fiber tips showed combined functions of antireflection and transmission enhancement for higher detection efficiency or signal-to-noise ratio because the FIB-milled nanoholes into the fiber tip endfaces could act as tapered air-filled nanopillars, changing the light propagation direction, enhancing the scattering effect, and allowing more photons to transmit along/near the glass/air interface to enhance the local evanescent field for sensing/detection.||URI:||https://hdl.handle.net/10356/102398
|ISSN:||1533-4880||DOI:||10.1166/jnn.2013.6698||Rights:||© 2013 American Scientific Publishers.||Fulltext Permission:||none||Fulltext Availability:||No Fulltext|
|Appears in Collections:||EEE Journal Articles|
MAE Journal Articles
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