dc.contributor.authorGong, Fang
dc.contributor.authorShi, Yiyu
dc.contributor.authorYu, Hao
dc.contributor.authorHe, Lei
dc.date.accessioned2014-04-11T07:51:44Z
dc.date.available2014-04-11T07:51:44Z
dc.date.copyright2013en_US
dc.date.issued2013
dc.identifier.citationGong, F., Shi, Y., Yu, H., & He, L. (2014). Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges. IEEE Design & Test, 1-1.en_US
dc.identifier.issn2168-2356en_US
dc.identifier.urihttp://hdl.handle.net/10220/19252
dc.description.abstractWith technology scaling down to 90nm and below, process variation has become a primary challenge for both design and fabrication of analog/mixed-signal circuits due to significantly increased circuit failures and yield loss. As a result, it is urgently required to estimate the yield of one design efficiently in the presence of process variation. In this paper, we present the recent advance for yield estimation for analog/mixed-signal circuits with a number of critical topics and techniques discussed and classified into two categories. The first is performance domain method, which requires extensive Monte Carlo simulations; and the second is parameter domain method, which requires the characterization of yield boundary defined by performance constraints without using Monte Carlo. We review the pros and cons of these methods, which are evaluated by a number of circuit examples with quantitative comparison.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesIEEE design & testen_US
dc.rights© 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/MDAT.2014.2299279].en_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering
dc.titleVariability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challengesen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/MDAT.2014.2299279
dc.description.versionAccepted versionen_US


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