dc.contributor.authorSong, Yang
dc.contributor.authorYu, Hao
dc.contributor.authorDinakarRao, Sai Manoj Pudukotai
dc.date.accessioned2014-04-11T07:57:00Z
dc.date.available2014-04-11T07:57:00Z
dc.date.copyright2014en_US
dc.date.issued2014
dc.identifier.citationSong, Y., Yu, H., & DinakarRao, S. M. P. (2014). Reachability-based robustness verification and optimization of SRAM dynamic stability under process variations. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 33(4), 585-598.en_US
dc.identifier.issn0278-0070en_US
dc.identifier.urihttp://hdl.handle.net/10220/19254
dc.description.abstractThe dynamic stability margin of SRAM is largely suppressed at nanoscale due to not only dynamic noise but also process variation. This paper introduces an analog verification for SRAM dynamic stability under threshold-voltage variations. A zonotope-based reachability analysis by the backward Euler method is deployed for SRAM dynamic stability in state space with consideration of SRAM nonlinear dynamics. It can simultaneously consider multiple SRAM variation sources without multiple repeated computations. What is more, sensitivity analysis is developed for zonotope to optimize SRAM designs departing from unsafe regions by simultaneously tuning multiple SRAM device parameters. In addition, compared to the SRAM optimization by single-parameter small-signal sensitivity, the proposed method can converge faster with higher accuracy. As shown by numerical experiments, the proposed optimization method can achieve 600× speedup on average when compared to the repeated Monte Carlo simulations under the similar accuracy.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesIEEE transactions on computer-aided design of integrated circuits and systemsen_US
dc.rights© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/TCAD.2014.2304704].en_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering
dc.titleReachability-based robustness verification and optimization of SRAM dynamic stability under process variationsen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/TCAD.2014.2304704
dc.description.versionAccepted versionen_US


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