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|Title:||Automatic metric advancing front triangulation over curved surfaces||Authors:||Lee, Chi King||Keywords:||DRNTU::Engineering::Civil engineering::Structures and design||Issue Date:||2000||Source:||Lee, C. (2000). Automatic metric advancing front triangulation over curved surfaces. Engineering Computations, 17(1), 48-74.||Series/Report no.:||Engineering computations||Abstract:||A 3D surface mesh generation scheme is suggested for the triangulation of general bi-variate surfaces. The target surface to be meshed is represented as a union of bi-variate sub-surfaces and hence a wide range of surfaces can be modelled. Different useful features such as repeated curves, crack lines and surface branches are included in the geometrical and topological models to increase the flexibility of the mesh generation scheme. The surface metric tensor specification is employed to define and control the element characteristics in the mesh generation procedure. A robust metric triangulation kernel is used for parametric space mesh generation. The shape qualities of the sub-surface meshes generated are then improved by using some ad hoc mesh quality enhancement schemes before they are combined together to form the final mesh. Numerical examples indicate that high quality surface meshes with rapid varying element size and stretching characteristics can be generated within a reasonable time limit in a few mesh adaptive iterations.||URI:||https://hdl.handle.net/10356/103284
|ISSN:||0264-4401||DOI:||http://dx.doi.org/10.1108/02644400010308080||Rights:||© 2000 Emerald Group Publishing Limited. This is the author created version of a work that has been peer reviewed and accepted for publication by Engineering Computations, Emerald Group Publishing Limited. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1108/02644400010308080].||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||CEE Journal Articles|
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