Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter
Tan, Cher Ming
Yu, Wen Zhi
Date of Issue2014
School of Electrical and Electronic Engineering
In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure sites before destructive physical analysis of the degraded limiters.
DRNTU::Engineering::Electrical and electronic engineering
© 2014 Elsevier Ltd.