Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/100167
Title: | Improvement of rectification effects in diffuser/nozzle structures with viscoelastic fluids | Authors: | Nguyen, Nam-Trung Lam, Yee-Cheong Ho, Soon-Seng Low, Cassandra Lee-Ngo |
Keywords: | DRNTU::Engineering::Mechanical engineering::Fluid mechanics | Issue Date: | 2008 | Source: | Nguyen, N.-T., Lam, Y.-C., Ho, S.-S., & Low, C. L.-N. (2008). Improvement of rectification effects in diffuser/nozzle structures with viscoelastic fluids. Biomicrofluidics, 2(3), 034101-. | Series/Report no.: | Biomicrofluidics | Abstract: | This paper reports the improvement of rectification effects in diffuser/nozzle structures with viscoelastic fluids. Since rectification in a diffuser/nozzle structure with Newtonian fluids is caused by inertial effects, micropumps based on this concept require a relatively high Reynolds numbers and high pumping frequencies. In applications with relatively low Reynolds numbers, anisotropic behavior can be achieved with viscoelastic effects. In our investigations, a solution of dilute polyethylene oxide was used as the viscoelastic fluid. A microfluidic device was fabricated in silicon using deep reactive ion etching. The microfluidic device consists of access ports for pressure measurement, and a series of ten diffuser/nozzle structures. Measurements were carried out for diffuser/nozzle structures with opening angles ranging from 15° to 60°. Flow visualization,pressure drop and diodicity of de-ionized water and the viscoelastic fluid were compared and discussed. The improvement of diodicity promises a simple pumping concept at low Reynolds numbers for lab-on-a-chip applications. | URI: | https://hdl.handle.net/10356/100167 http://hdl.handle.net/10220/24103 |
ISSN: | 1932-1058 | DOI: | 10.1063/1.2959099 | Schools: | School of Electrical and Electronic Engineering School of Mechanical and Aerospace Engineering |
Rights: | © 2008 American Institute of Physics. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles MAE Journal Articles |
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