Measurement of large discontinuities using single white light interferogram white light interferogram
Upputuri, Paul Kumar
Nandigana, Krishna Mohan
Kothiyal, Mahendra Prasad
Date of Issue2014
School of Chemical and Biomedical Engineering
White light interferometry is a widely used tool to extend the unambiguous measurement range of a monochromatic interferometer. In this work, we discuss Hilbert transformation analysis of a single white light interferogram acquired with a single-chip color CCD camera for step height measurement which lies beyond the unambiguous range of the monochromatic interferometry. The color interferogram is decomposed and phase maps for red, green, and blue components are calculated independently using Hilbert transformation. This procedure makes the measurement faster, simpler, and cost-effective. The usefulness of the technique is demonstrated on micro-sample.
© 2014 Optical Society of America. This is the author created version of a work that has been peer reviewed and accepted for publication by Optics Express, Optical Society of America. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [Article DOI: http://dx.doi.org/10.1364/OE.22.027373].