dc.contributor.authorZhang, Yuxiang
dc.contributor.authorBoon, Chirn Chye
dc.date.accessioned2015-03-02T00:57:02Z
dc.date.available2015-03-02T00:57:02Z
dc.date.copyright2014en_US
dc.date.issued2014
dc.identifier.citationZhang, Y., & Boon, C. C. (2014). An in-phase-coupled class-C quadrature VCO with tunable phase error. IEEE microwave and wireless components letters, 24(11), 796-798.en_US
dc.identifier.urihttp://hdl.handle.net/10220/25140
dc.description.abstractThis letter presents the design and analysis of a novel in-phase-coupled (IPC) Class-C Quadrature Voltage-Controlled Oscillator (QVCO) with tunable phase error. The IPC QVCO employs a novel coupling structure that generates in-phase coupling signal while consuming negligible power itself. IPC scheme enables the QVCO to achieve better phase noise and phase error compared to that of the conventional QVCO. The phase error of the proposed IPC QVCO is also tunable. The proposed IPC QVCO is fabricated using 0.18 μm CMOS technology and the measured output frequency range is from 2.5 to 2.97 GHz. At 2.623 GHz, with 3.6 mW power consumption, the phase noise at 1 MHz offset achieves -126.8 dBc/Hz while the phase error before phase error tuning is 0.5 °. The measured phase error tuning range is ±17°.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesIEEE microwave and wireless components lettersen_US
dc.rights© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [Article DOI: http://dx.doi.org/10.1109/LMWC.2014.2352794].en_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Wireless communication systems
dc.titleAn in-phase-coupled class-C quadrature VCO with tunable phase erroren_US
dc.typeJournal Article
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/LMWC.2014.2352794
dc.description.versionAccepted versionen_US
dc.identifier.rims183481


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