dc.contributor.authorZhang, Li
dc.contributor.authorChang, Chip-Hong
dc.date.accessioned2015-03-03T09:24:44Z
dc.date.available2015-03-03T09:24:44Z
dc.date.copyright2014en_US
dc.date.issued2014
dc.identifier.citationZhang, L., & Chang, C.-H. (2014). Hardware Trojan detection with linear regression based gate-level characterization. 2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), 256-259.en_US
dc.identifier.urihttp://hdl.handle.net/10220/25169
dc.description.abstractDue to outsourcing of IC fabrication, chip supply contamination is a clear and present danger, of which hardware Trojans (HTs) pose the greatest threat. This paper reviews the limitation of existing gate level characterization approaches to HT detection and presents a new detection method with a faster estimation of gate scaling factors by solving the normal equation of linear regression model. The HT-infected circuit can be distinguished from the genuine circuit without the need for a golden reference chip by their discrepancies in the bias parameter of the linear regression and a subset of the accurately estimated scaling factors. It has high detection sensitivity as long as the Trojan-to-circuit gate count ratio exceeds 0.4%.en_US
dc.format.extent4 p.en_US
dc.language.isoenen_US
dc.relation.ispartofseries
dc.rights© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/APCCAS.2014.7032768].en_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems
dc.titleHardware Trojan detection with linear regression based gate-level characterizationen_US
dc.typeConference Paper
dc.contributor.conference2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)en_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/APCCAS.2014.7032768
dc.description.versionAccepted versionen_US
dc.identifier.rims183020


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