dc.contributor.authorQian, Kemao
dc.contributor.editorCreath, Katherine*
dc.contributor.editorBurke, Jan*
dc.contributor.editorSchmit, Joanna*
dc.date.accessioned2015-03-09T06:18:29Z
dc.date.available2015-03-09T06:18:29Z
dc.date.copyright2014en_US
dc.date.issued2014
dc.identifier.citationQian, K. (2014). Links between fringe pattern analysis and digital image correlation : windowed, optimal, and tracking (WOT). Proceedings of SPIE- Interferometry XVII: Techniques and Analysis, 9203, 92030M-.en_US
dc.identifier.urihttp://hdl.handle.net/10220/25200
dc.description.abstractA windowed, optimal and tracking (WOT) strategy for measurement data analysis is described, explained and discussed. Many fringe pattern analysis and digital image correlation algorithms adopted this strategy, and thus their similarities and links are revealed. Although this strategy is not new, highlighting it is believed to be helpful for future algorithm development.en_US
dc.format.extent6 p.en_US
dc.language.isoenen_US
dc.rights© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE- Interferometry XVII: Techniques and Analysis and is made available as an electronic reprint (preprint) with permission of Society of Photo-Optical Instrumentation Engineers (SPIE). The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/12.2059757].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en_US
dc.subjectDRNTU::Engineering::Computer science and engineering::Software::Programming techniques
dc.titleLinks between fringe pattern analysis and digital image correlation : windowed, optimal, and tracking (WOT)en_US
dc.typeConference Paper
dc.contributor.conferenceInterferometry XVII: Techniques and Analysisen_US
dc.contributor.schoolSchool of Computer Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1117/12.2059757
dc.description.versionPublished versionen_US


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