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|Title:||A device for the application of uniaxial strain to single crystal samples for use in synchrotron radiation experiments||Authors:||Gannon, L.
Burkovsky, R. G.
Petrović, Alexander Paul
|Keywords:||Physics and Applied Physics||Issue Date:||2015||Source:||Gannon, L., Bosak, A., Burkovsky, R. G., Nisbet, G., Petrović, A. P., & Hoesch, M. (2015). A device for the application of uniaxial strain to single crystal samples for use in synchrotron radiation experiments. Review of Scientific Instruments, 86(10), 103904-.||Series/Report no.:||Review of Scientific Instruments||Abstract:||We present the design, construction, and testing of a straining device compatible with many different synchrotron radiation techniques, in a wide range of experimental environments (including low temperature, high field and ultra-high vacuum). The device has been tested by X-ray diffraction on single crystal samples of quasi-one-dimensional Cs2Mo6Se6 and K2Mo6Se6, in which microscopic strains up to a Δc/c = 0.12% ± 0.01% change in the c lattice parameters have been achieved. We have also used the device in an inelastic X-ray scattering experiment, to probe the strain-dependent speed of sound ν along the c axis. A reduction Δν/ν of up to −3.8% was obtained at a strain of Δc/c = 0.25% in K2Mo6Se6.||URI:||https://hdl.handle.net/10356/81189
|ISSN:||0034-6748||DOI:||10.1063/1.4933383||Rights:||© 2015 AIP Publishing LLC. This paper was published in Review of Scientific Instruments and is made available as an electronic reprint (preprint) with permission of AIP Publishing LLC. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.4933383]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||SPMS Journal Articles|
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