dc.contributor.authorQiu, Haodong
dc.contributor.authorWang, Hong
dc.contributor.authorKe, Feixiang
dc.identifier.citationQiu, H., Wang, H., & Ke, F. (2014). Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches. Applied Physics Letters, 104(25), 254102-.en_US
dc.description.abstractThe noise behavior of Au-to-Au microcontact for microelectromechanical system switches has been experimentally studied in the unstable contact region. The results suggest that the electrical conduction remains nonmetallic at the initial stage during contact formation due to the existence of alien films, and traps in the alien layer located at the contact interface could play an important role in determining the conduction noise. The conduction fluctuation induced by electron trapping-detrapping associated with the hydrocarbon layer is found to be an intrinsic noise source contributing to the low frequency noise in the unstable contact region.en_US
dc.description.sponsorshipASTAR (Agency for Sci., Tech. and Research, S’pore)en_US
dc.format.extent4 p.en_US
dc.relation.ispartofseriesApplied Physics Lettersen_US
dc.rights© 2014 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The published version is available at: [http://dx.doi.org/10.1063/1.4886116]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en_US
dc.subjectMicroelectromechanical systemsen_US
dc.subject1/f noiseen_US
dc.titleLow frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switchesen_US
dc.typeJournal Article
dc.contributor.researchTemasek Laboratoriesen_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.versionPublished versionen_US

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