Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/83621
Title: Variance analysis of robust state estimation in power system using influence function
Authors: Ho, Weng Khuen
Chen, Tengpeng
Ling, Keck Voon
Sun, Lu
Keywords: Robust state estimation
M-estimator
Issue Date: 2017
Source: Ho, W. K., Chen, T., Ling, K. V., & Sun, L. (2017). Variance analysis of robust state estimation in power system using influence function. International Journal of Electrical Power & Energy Systems, 92, 53-62.
Series/Report no.: International Journal of Electrical Power & Energy Systems
Abstract: An analytical equation is derived using influence function approximation to calculate the variance of the state estimate for traditional robust state estimators such as the Quadratic-Constant, Quadratic-Linear, Square-Root, Schweppe-Huber Generalized-M and Multiple-Segment estimator. The equation gives insights into the precision of the estimation. Using the equation, the variance of a state estimate can be expressed as a function of measurement noise variances enabling the selection of sensors for a specified estimator precision. It can also be used to search for the optimum estimator parameters to give the minimum sum of variances. The well-known Weighted-Least-Squares variance formula is a special case of the equation and simulations on the IEEE 14-bus system are given to show the usefulness of the equation.
URI: https://hdl.handle.net/10356/83621
http://hdl.handle.net/10220/42695
ISSN: 0142-0615
DOI: 10.1016/j.ijepes.2017.04.009
Rights: © 2017 Elsevier. This is the author created version of a work that has been peer reviewed and accepted for publication by International Journal of Electrical Power & Energy Systems, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1016/j.ijepes.2017.04.009].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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