dc.contributor.authorPrabhakaran, Rama Aravind
dc.contributor.authorZhou, Yilong
dc.contributor.authorZhao, Cunlu
dc.contributor.authorHu, Guoqing
dc.contributor.authorSong, Yongxin
dc.contributor.authorWang, Junsheng
dc.contributor.authorYang, Chun
dc.contributor.authorXuan, Xiangchun
dc.date.accessioned2017-08-02T05:10:07Z
dc.date.available2017-08-02T05:10:07Z
dc.date.issued2017
dc.identifier.citationPrabhakaran, R. A., Zhou, Y., Zhao, C., Hu, G., Song, Y., Wang, J., et al. (2017). Induced charge effects on electrokinetic entry flow. Physics of Fluids, 29(6), 062001-.en_US
dc.identifier.issn1070-6631en_US
dc.identifier.urihttp://hdl.handle.net/10220/43527
dc.description.abstractElectrokinetic flow, due to a nearly plug-like velocity profile, is the preferred mode for transport of fluids (by electroosmosis) and species (by electrophoresis if charged) in microfluidic devices. Thus far there have been numerous studies on electrokinetic flow within a variety of microchannel structures. However, the fluid and species behaviors at the interface of the inlet reservoir (i.e., the well that supplies the fluid and species) and microchannel are still largely unexplored. This work presents a fundamental investigation of the induced charge effects on electrokinetic entry flow due to the polarization of dielectric corners at the inlet reservoir-microchannel junction. We use small tracing particles suspended in a low ionic concentration fluid to visualize the electrokinetic flow pattern in the absence of Joule heating effects. Particles are found to get trapped and concentrated inside a pair of counter-rotating fluid circulations near the corners of the channel entrance. We also develop a depth-averaged numerical model to understand the induced charge on the corner surfaces and simulate the resultant induced charge electroosmosis (ICEO) in the horizontal plane of the microchannel. The particle streaklines predicted from this model are compared with the experimental images of tracing particles, which shows a significantly better agreement than those from a regular two-dimensional model. This study indicates the strong influences of the top/bottom walls on ICEO in shallow microchannels, which have been neglected in previous two-dimensional models.en_US
dc.format.extent10 p.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesPhysics of Fluidsen_US
dc.rights© 2017 American Institute of Physics (AIP). This paper was published in Physics of Fluids and is made available as an electronic reprint (preprint) with permission of American Institute of Physics (AIP). The published version is available at: [http://dx.doi.org/10.1063/1.4984741]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en_US
dc.subjectElectric fieldsen_US
dc.subjectMicroscale flowsen_US
dc.titleInduced charge effects on electrokinetic entry flowen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.4984741
dc.description.versionPublished versionen_US


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