Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/86690
Title: New reduction factor for cracked multi-planar square hollow section TT-, YT- and KT-joints
Authors: Lie, Seng Tjhen
Vipin, Sukumara Pillai
Li, Tao
Keywords: Finite Element Analysis
Multi-planar Joints
Issue Date: 2017
Source: Lie, S. T., Vipin, S. P., & Li, T. (2017). New reduction factor for cracked multi-planar square hollow section TT-, YT- and KT-joints. Engineering Structures, 139, 108-119.
Series/Report no.: Engineering Structures
Abstract: Many existing multi-planar structures such as bridges, buildings and others are fabricated using square hollow section (SHS) members. There are no guidance’s available in the design codes to assess the safety and integrity of these cracked multi-planar SHS joints till date. This paper proposes a new set of equations for determining the reduction factor (FAR) of cracked multi-planar SHS TT-, YT- and KT-joints. A completely new and robust finite element (FE) mesh generator is developed and it is validated using the experimental test results. Parametric study is carried out for multi-planar SHS joints subjected to axial loading at the brace end. The results reveal that the crack area and the brace to chord width ratio (β) have an important effect on the plastic collapse load of the cracked SHS joints. For a particular β value, the FAR varies up to 4.37% for different values of crack area.
URI: https://hdl.handle.net/10356/86690
http://hdl.handle.net/10220/44167
ISSN: 0141-0296
DOI: 10.1016/j.engstruct.2017.02.041
Rights: © 2017 Elsevier Ltd. This is the author created version of a work that has been peer reviewed and accepted for publication by Engineering Structures, Elsevier Ltd. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1016/j.engstruct.2017.02.041].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:CEE Journal Articles

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