Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/87073
Title: Impact of the Wireless Network’s PHY Security and Reliability on Demand-Side Management Cost in the Smart Grid
Authors: El Shafie, Ahmed
Niyato, Dusit
Hamila, Ridha
Al-Dhahir, Naofal
Keywords: Artificial Noise
Active and Passive Attacks
Issue Date: 2017
Source: El Shafie, A., Niyato, D., Hamila, R., & Al-Dhahir, N. (2017). Impact of the Wireless Network’s PHY Security and Reliability on Demand-Side Management Cost in the Smart Grid. IEEE Access, 5, 5678-5689.
Series/Report no.: IEEE Access
Abstract: We investigate the impact of the wireless network's physical layer (PHY) security and reliability on demand-side management operation in the smart grid. We assume that consumers communicate their energy demands with the utility, and we investigate the tradeoff between the wireless network's PHY security and reliability. We consider passive and active attacks on the smart grid, and show their impacts on both the wireless communications system's reliability and security. To improve the wireless communications system's security, we propose an artificial-noise (AN)-aided scheme for orthogonal-division multiplexing-based wireless systems. We show that increasing the PHY security of the legitimate transmissions decreases the communication reliability between the smart meters and the meter data-management system since to secure the transmissions, a portion of the transmit powers will be assigned to AN signal transmissions. To further secure the smart meters' transmissions and enhance their reliability, we propose a new encoding scheme where the data are encoded over the available smart meters' communication (i.e., non-idle) times in a given hour.
URI: https://hdl.handle.net/10356/87073
http://hdl.handle.net/10220/44288
DOI: http://dx.doi.org/10.1109/ACCESS.2017.2695520
Rights: © 2017 IEEE. Translations and content mining are permitted for academic research only. Personal use is also permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Journal Articles

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