Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/86903
Title: Photonic nanojet engineering to achieve super-resolution in photoacoustic microscopy: a simulation study
Authors: Upputuri, Paul Kumar
Krisnan, Mogana Sundari
Moothanchery, Mohesh
Pramanik, Manojit
Keywords: Photoacoustic Nanoscopy
Super-resolution
Issue Date: 2017
Source: Upputuri, P. K., Krisnan, M. S., Moothanchery, M., & Pramanik, M. (2017). Photonic nanojet engineering to achieve super-resolution in photoacoustic microscopy: a simulation study. Proceedings of SPIE - Photons Plus Ultrasound: Imaging and Sensing 2017, 10064, 100644S-.
Abstract: Label-free photoacoustic microscopy (PAM) with nanometric resolution is important to study cellular and sub-cellular structures, microcirculation systems, micro-vascularization, and tumor angiogenesis etc. But, the lateral resolution of a conventional microscopy is limited by optical diffraction. The photonic nanojet generated by silica microspheres can break this diffraction limit. Single silica sphere can provide narrow photonic jet, however its short length and short working distance limits its applications to surface imaging. It is possible to increase the length of the photonic nanojet and its working distance by optimizing the sphere design and its optical properties. In this work, we will present various sphere designs to achieve ultra-long and long-working distance photonic nanojets for far-field imaging. The nanojets thus generated will be used to demonstrate super-resolution photo-acoustic imaging using k-wave simulations. The study will provide new opportunities for many biomedical imaging applications that require finer resolution.
URI: https://hdl.handle.net/10356/86903
http://hdl.handle.net/10220/44306
DOI: http://dx.doi.org/10.1117/12.2250483
Rights: © 2017 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - Photons Plus Ultrasound: Imaging and Sensing 2017 and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/12.2250483]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
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