Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/87275
Title: Online fringe projection profilometry based on scale-invariant feature transform
Authors: Li, Hongru
Feng, Guoying
Yang, Peng
Wang, Zhaomin
Zhou, Shouhuan
Asundi, Anand
Keywords: Online Measurement
Fringe Projection Profilometry
Issue Date: 2016
Source: Li, H., Feng, G., Yang, P., Wang, Z., Zhou, S., & Asundi, A. (2016). Online fringe projection profilometry based on scale-invariant feature transform. Optical Engineering, 55(8), 084101-.
Series/Report no.: Optical Engineering
Abstract: An online fringe projection profilometry (OFPP) based on scale-invariant feature transform (SIFT) is proposed. Both rotary and linear models are discussed. First, the captured images are enhanced by “retinex” theory for better contrast and an improved reprojection technique is carried out to rectify pixel size while keeping the right aspect ratio. Then the SIFT algorithm with random sample consensus algorithm is used to match feature points between frames. In this process, quick response code is innovatively adopted as a feature pattern as well as object modulation. The characteristic parameters, which include rotation angle in rotary OFPP and rectilinear displacement in linear OFPP, are calculated by a vector-based solution. Moreover, a statistical filter is applied to obtain more accurate values. The equivalent aligned fringe patterns are then extracted from each frame. The equal step algorithm, advanced iterative algorithm, and principal component analysis are eligible for phase retrieval according to whether the object moving direction accords with the fringe direction or not. The three-dimensional profile of the moving object can finally be reconstructed. Numerical simulations and experimental results verified the validity and feasibility of the proposed method.
URI: https://hdl.handle.net/10356/87275
http://hdl.handle.net/10220/44386
ISSN: 0091-3286
DOI: http://dx.doi.org/10.1117/1.OE.55.8.084101
Rights: © 2016 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Optical Engineering and is made available as an electronic reprint (preprint) with permission of SPIE. The published version is available at: [http://dx.doi.org/10.1117/1.OE.55.8.084101]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles

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