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|Title:||An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector||Authors:||Breier, Jakub
|Keywords:||Fault Injection Attack
Hooge Phase Detector
|Issue Date:||2017||Source:||Breier, J., Bhasin, S., & He, W. (2017). An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector. 2017 18th International Symposium on Quality Electronic Design (ISQED), 307-312.||Series/Report no.:||Abstract:||Fault injection attack against embedded devices has attracted much attention in recent years. As a highly efficient fault injection, EM fault injection (EMFI) outperforms other injection means owing to its outstanding penetration capability in incurring local faults into security ICs. In this paper, we present an all digital countermeasure for detecting the on-the-fly EMFI attempts in silicon chips. The proposed logic consists of a watchdog ring-oscillator (RO), and a Hogge Phase Detector (PD) for sensing the frequency turbulence induced by the ongoing EMFIs. Experimental validation on Xilinx FPGA Virtex-5 FPGA reports a fault detection rate of 93.15% and a failure rate of 0.0069, with negligible overhead. A significant security margin for alerting the injection attempt is also noticeable. The technique is versatile and can be integrated in any VLSI design for its lightweight and all digital architecture, especially for the security-critical scenarios, such as the endpoints of Internet-of-Things (IoT).||URI:||https://hdl.handle.net/10356/88795
|DOI:||http://dx.doi.org/10.1109/ISQED.2017.7918333||Rights:||© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/ISQED.2017.7918333].||metadata.item.grantfulltext:||open||metadata.item.fulltext:||With Fulltext|
|Appears in Collections:||TL Conference Papers|
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