Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/88795
Title: An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector
Authors: Breier, Jakub
Bhasin, Shivam
He, Wei
Keywords: Fault Injection Attack
Hooge Phase Detector
Issue Date: 2017
Source: Breier, J., Bhasin, S., & He, W. (2017). An Electromagnetic Fault Injection Sensor using Hogge Phase-Detector. 2017 18th International Symposium on Quality Electronic Design (ISQED), 307-312.
Abstract: Fault injection attack against embedded devices has attracted much attention in recent years. As a highly efficient fault injection, EM fault injection (EMFI) outperforms other injection means owing to its outstanding penetration capability in incurring local faults into security ICs. In this paper, we present an all digital countermeasure for detecting the on-the-fly EMFI attempts in silicon chips. The proposed logic consists of a watchdog ring-oscillator (RO), and a Hogge Phase Detector (PD) for sensing the frequency turbulence induced by the ongoing EMFIs. Experimental validation on Xilinx FPGA Virtex-5 FPGA reports a fault detection rate of 93.15% and a failure rate of 0.0069, with negligible overhead. A significant security margin for alerting the injection attempt is also noticeable. The technique is versatile and can be integrated in any VLSI design for its lightweight and all digital architecture, especially for the security-critical scenarios, such as the endpoints of Internet-of-Things (IoT).
URI: https://hdl.handle.net/10356/88795
http://hdl.handle.net/10220/44742
DOI: 10.1109/ISQED.2017.7918333
Rights: © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/ISQED.2017.7918333].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Conference Papers

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