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|Title:||An Industrial Outlook on Challenges of Hardware Security in Digital Economy—Extended Abstract—||Authors:||Bhasin, Shivam
|Issue Date:||2017||Source:||Bhasin, S., Lomné, V., & Tobich, K. (2017). An Industrial Outlook on Challenges of Hardware Security in Digital Economy—Extended Abstract—. 2017 International Conference on Security, Privacy, and Applied Cryptography Engineering, 1-9.||Series/Report no.:||Abstract:||Thanks to the seminal works of Kocher on side-channel attacks [1, 2] and Boneh et al. on fault injection attacks  in the 1990s, the domain of physical attacks has emerged as an active research domain as well as a potential threat on commercial devices. Practical hacks using physical attacks have been demonstrated on commercial products like NXP MiFare , KEELOQ , Sony PlayStation, etc. The threat becomes even bigger with the emergence of the Internet of Things (IoT), digital economy and identity. Digital economy is a push towards cashless society, encouraging digital banking with use of modern payment methods based on smartcards and now smartphones. Digital identity now uses biometric data, like fingerprints, to authenticate people. Several governments are giving a push for digital economy and identity. This has led to rapid adoption of mobile payments, cashless solutions, biometric identities. Often biometrics are linked to payment solution.||URI:||https://hdl.handle.net/10356/88921
|DOI:||http://dx.doi.org/10.1007/978-3-319-71501-8_1||Rights:||© 2017 Springer International Publishing AG. This is the author created version of a work that has been peer reviewed and accepted for publication by 2017 International Conference on Security, Privacy, and Applied Cryptography Engineering, Springer International Publishing AG. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1007/978-3-319-71501-8_1].||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||TL Conference Papers|
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