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Title: Stability analysis of event-triggered anytime control with multiple control laws
Authors: Ling, Keck Voon
Quevedo, Daniel E.
Dang, Thuy Van
Keywords: Anytime Control
Control With Time-varying Processor Availability
Issue Date: 2018
Source: Dang, T. V., Ling, K. V., & Quevedo, D. E. (2018). Stability Analysis of Event-Triggered Anytime Control with Multiple Control Laws. IEEE Transactions on Automatic Control, in press.
Series/Report no.: IEEE Transactions on Automatic Control
Abstract: To deal with time-varying processor availability and lossy communication channels in embedded and networked control systems, one can employ an event-triggered sequence-based anytime control (E-SAC) algorithm. The main idea of E-SAC is, when computing resources and measurements are available, to compute a sequence of tentative control inputs and store them in a buffer for potential future use. State-dependent Random-time Drift (SRD) approach is often used to analyse and establish stability properties of such E-SAC algorithms. However, using SRD, the analysis quickly becomes combinatoric and hence difficult to extend to more sophisticated E-SAC. In this technical note, we develop a general model and a new stability analysis for E-SAC based on Markov jump systems. Using the new stability analysis, stochastic stability conditions of existing E-SAC are also recovered. In addition, the proposed technique systematically extends to a more sophisticated E-SAC scheme for which, until now, no analytical expression had been obtained.
ISSN: 0018-9286
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles
IGS Journal Articles

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