dc.contributor.authorYang, Peng
dc.contributor.authorWang, Zhaomin
dc.contributor.authorZhang, Wei
dc.contributor.authorZhao, Hongying
dc.contributor.authorQu, Weijuan
dc.contributor.authorZhao, Haimeng
dc.contributor.authorAsundi, Anand
dc.contributor.authorYan, Lei
dc.identifier.citationYang, P., Wang, Z., Zhang, W., Zhao, H., Qu, W., Zhao, H., et al. (2018). Depth profile measurement with lenslet images of the plenoptic camera. Optical Engineering, 57(3), 033106-.en_US
dc.description.abstractAn approach for carrying out depth profile measurement of an object with the plenoptic camera is proposed. A single plenoptic image consists of multiple lenslet images. To begin with, these images are processed directly with a refocusing technique to obtain the depth map, which does not need to align and decode the plenoptic image. Then, a linear depth calibration is applied based on the optical structure of the plenoptic camera for depth profile reconstruction. One significant improvement of the proposed method concerns the resolution of the depth map. Unlike the traditional method, our resolution is not limited by the number of microlenses inside the camera, and the depth map can be globally optimized. We validated the method with experiments on depth map reconstruction, depth calibration, and depth profile measurement, with the results indicating that the proposed approach is both efficient and accurate.en_US
dc.description.sponsorshipMOE (Min. of Education, S’pore)en_US
dc.format.extent8 p.en_US
dc.relation.ispartofseriesOptical Engineeringen_US
dc.rights© 2018 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in Optical Engineering and is made available as an electronic reprint (preprint) with permission of Society of Photo-Optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/1.OE.57.3.033106]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en_US
dc.subjectDepth Profile Measurementen_US
dc.titleDepth profile measurement with lenslet images of the plenoptic cameraen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen_US
dc.description.versionPublished versionen_US
dc.contributor.organizationCentre for Optical and Laser Engineeringen_US

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