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|Title:||Multiplexing and de-multiplexing with scattering media for large field of view and multispectral imaging||Authors:||Sahoo, Sujit Kumar
|Issue Date:||2018||Source:||Sahoo, S. K., Tang, D., & Dang, C. (2018). Multiplexing and de-multiplexing with scattering media for large field of view and multispectral imaging. Proceedings of SPIE - Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV, 10499, 104991W-.||Abstract:||Large field of view multispectral imaging through scattering medium is a fundamental quest in optics community. It has gained special attention from researchers in recent years for its wide range of potential applications. However, the main bottlenecks of the current imaging systems are the requirements on specific illumination, poor image quality and limited field of view. In this work, we demonstrated a single-shot high-resolution colour-imaging through scattering media using a monochromatic camera. This novel imaging technique is enabled by the spatial, spectral decorrelation property and the optical memory effect of the scattering media. Moreover the use of deconvolution image processing further annihilate above-mentioned drawbacks arise due iterative refocusing, scanning or phase retrieval procedures.||URI:||https://hdl.handle.net/10356/89253
|DOI:||10.1117/12.2289314||Rights:||© 2018 SPIE. This paper was published in Proceedings of SPIE - Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV and is made available as an electronic reprint (preprint) with permission of SPIE. The published version is available at: [http://dx.doi.org/10.1117/12.2289314]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Conference Papers|
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