Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/89334
Title: Electrochemically Driven Giant Resistive Switching in Perovskite Nickelates Heterostructures
Authors: Wang, Le
Zhang, Qinghua
Chang, Lei
You, Lu
He, Xu
Jin, Kuijuan
Gu, Lin
Guo, Haizhong
Ge, Chen
Feng, Yaqing
Wang, Junling
Keywords: Heterostructures
Memory
Issue Date: 2017
Source: Wang, L., Zhang, Q., Chang, L., You, L., He, X., Jin, K., et al. (2017). Electrochemically Driven Giant Resistive Switching in Perovskite Nickelates Heterostructures. Advanced Electronic Materials, 3(10), 1700321-.
Series/Report no.: Advanced Electronic Materials
Abstract: The rich phase diagrams and peculiar physical properties of rare earth perovskite nickelates (RNiO3) have recently attracted much attention. Their electronic structures are highly sensitive to carrier density and bandwidth due to Mott physics. Here, the electrochemically driven giant resistive switching in Pt/RNiO3/Nb‐SrTiO3 heterostructures is reported. Systematic investigation confirms that oxygen vacancies migration modifies the interfacial barrier at the RNiO3/Nb‐SrTiO3 interface and causes the resistive switching behavior. An ON/OFF ratio of about 105 at room temperature is observed, which can be modulated by controlling the oxygen vacancies during sample fabrication or by varying the rare earth element in RNiO3. The findings provide an important step forward toward the development of multifunctional electronic devices based on perovskite nickelates.
URI: https://hdl.handle.net/10356/89334
http://hdl.handle.net/10220/44855
DOI: 10.1002/aelm.201700321
Rights: © 2017 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim. This is the author created version of a work that has been peer reviewed and accepted for publication by Advanced Electronic Materials, Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1002/aelm.201700321].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MSE Journal Articles

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