Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/86218
Title: Optical haze of randomly arranged silver nanowire transparent conductive films with wide range of nanowire diameters
Authors: Marus, Mikita
Hubarevich, Aliaksandr
Fan, Wei Jun
Wang, Hong
Smirnov, A.
Wang, K.
Huang, H.
Sun, X. W.
Keywords: Optical Haze
Silver Nanowire
Issue Date: 2018
Source: Marus, M., Hubarevich, A., Fan, W. J., Wang, H., Smirnov, A., Wang, K., et al. (2018). Optical haze of randomly arranged silver nanowire transparent conductive films with wide range of nanowire diameters. AIP Advances, 8(3), 035201-.
Series/Report no.: AIP Advances
Abstract: The effect of the diameter of randomly arranged silver nanowires on the optical haze of silver nanowire transparent conductive films was studied. Proposed simulation model behaved similarly with the experimental results, and was used to theoretically study the optical haze of silver nanowires with diameters in the broad range from 30 nm and above. Our results show that a thickening of silver nanowires from 30 to 100 nm results in the increase of the optical haze up to 8 times, while from 100 to 500 nm the optical haze increases only up to 1.38. Moreover, silver nanowires with diameter of 500 nm possess up to 5% lower optical haze and 5% higher transmittance than 100 nm thick silver nanowires for the same 10-100 Ohm/sq sheet resistance range. Further thickening of AgNWs can match the low haze of 30 nm thick AgNWs, but at higher transmittance. The results obtained from this work allow deeper analysis of the silver nanowire transparent conductive films from the perspective of the diameter of nanowires for various optoelectronic devices.
URI: https://hdl.handle.net/10356/86218
http://hdl.handle.net/10220/45266
ISSN: 2158-3226
DOI: 10.1063/1.5020033
Rights: © 2018 Author(s) (published by American Institute of Physics). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.