Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/86295
Title: Broadband strip-line ferromagnetic resonance spectroscopy of soft magnetic CoFeTaZr patterned thin films
Authors: Jin, Tian Li
Nongjai, R.
Asokan, K.
Ghosh, A.
Aparnadevi, M.
Suri, P.
Piramanayagam, S. N.
Gupta, Surbhi
Kumar, Durgesh
Keywords: Ferromagnetic Resonance Spectroscopy
Patterned Thin Films
Issue Date: 2018
Source: Gupta, S., Kumar, D., Jin, T. L., Nongjai, R., Asokan, K., Ghosh, A., et al. (2018). Broadband strip-line ferromagnetic resonance spectroscopy of soft magnetic CoFeTaZr patterned thin films. AIP Advances, 8(5), 056125-.
Series/Report no.: AIP Advances
Abstract: In this paper, magnetic and magnetization dynamic properties of compositionally patterned Co46Fe40Ta9Zr5 thin films are investigated. A combination of self-assembly and ion-implantation was employed to locally alter the composition of Co46Fe40Ta9Zr5 thin film in a periodic manner. 20 keV O+ and 60 keV N+ ions were implanted at different doses in order to modify the magnetization dynamic properties of the samples in a controlled fashion. Magnetic hysteresis loop measurements revealed significant changes in the coercivity for higher influences of 5 × 1016 ions per cm2. In particular, N+ implantation was observed to induce two phase formation with high and low coercivities. Broadband strip-line ferromagnetic resonance spectroscopy over wide range of frequency (8 – 20 GHz) was used to study the magnetization dynamics as a function of ion-beam dosage. With higher fluences, damping constant showed a continuous increase from 0.0103 to 0.0430. Such control of magnetic properties at nano-scale using this method is believed to be useful for spintronics and microwave device applications.
URI: https://hdl.handle.net/10356/86295
http://hdl.handle.net/10220/45277
ISSN: 2158-3226
DOI: http://dx.doi.org/10.1063/1.5007943
Rights: © 2018 The Author(s) (published by American Institute of Physics). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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