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Title: Inductively coupled on-line impedance measurement for condition monitoring of electrical equipment
Authors: Rathnayaka, Sooriya Bandara
See, Kye Yak
Li, Kangrong
Keywords: Condition Monitoring
On-line Impedance Extraction Technique
Issue Date: 2018
Source: Rathnayaka, S. B., See, K. Y., & Li, K. (2018). Inductively coupled on-line impedance measurement for condition monitoring of electrical equipment. IET Science, Measurement & Technology, 12(3), 382-387.
Series/Report no.: IET Science, Measurement & Technology
Abstract: Off-line periodic maintenance has been used to keep critical electrical equipment in good condition. However, there is an increasing demand for on-line condition monitoring of the electrical equipment for preventive maintenance purposes. An on-line impedance extraction technique based on an inductive coupling approach is explored for the detection of early signs of defects of electrical equipment. The proposed method is demonstrated experimentally using a custom-made transformer with emulated defects as equipment-under-test. To enhance the defect detection capability for impedance deviation, various statistical diagnostic indicators are also investigated. By combining the proposed on-line impedance extraction method and a suitable diagnostic indicator, early detection of the defect in electrical equipment becomes feasible.
ISSN: 1751-8822
Rights: © 2018 Institution of Engineering and Technology. This paper was published in IET Science, Measurement & Technology and is made available as an electronic reprint (preprint) with permission of Institution of Engineering and Technology. The published version is available at: []. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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