Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/87970
Title: Eigen-analysis reveals components supporting super-resolution imaging of blinking fluorophores
Authors: Agarwal, Krishna
Prasad, Dilip Kumar
Keywords: DRNTU::Engineering::Computer science and engineering
Blinking
Imaging
Issue Date: 2017
Source: Agarwal, K., & Prasad, D. K. (2017). Eigen-analysis reveals components supporting super-resolution imaging of blinking fluorophores. Scientific Reports, 7(1), 4445-.
Series/Report no.: Scientific Reports
Abstract: This paper presents eigen-analysis of image stack of blinking fluorophores to identify the components that enable super-resolved imaging of blinking fluorophores. Eigen-analysis reveals that the contributions of spatial distribution of fluorophores and their temporal photon emission characteristics can be completely separated. While cross-emitter cross-pixel information of spatial distribution that permits super-resolution is encoded in two matrices, temporal statistics weigh the contribution of these matrices to the measured data. The properties and conditions of exploitation of these matrices are investigated. Con-temporary super-resolution imaging methods that use blinking for super-resolution are studied in the context of the presented analysis. Besides providing insight into the capabilities and limitations of existing super-resolution methods, the analysis shall help in designing better super-resolution techniques that directly exploit these matrices.
URI: https://hdl.handle.net/10356/87970
http://hdl.handle.net/10220/45593
ISSN: 2045-2322
DOI: 10.1038/s41598-017-04544-5
Rights: © The Author(s) 2017. This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Journal Articles

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