Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/88286
Title: Tunable polarization conversion and rotation based on a reconfigurable metasurface
Authors: Zhang, M.
Zhang, Wu
Liu, Ai Qun
Li, F. C.
Lan, C. F.
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Polarization Microscopy
Rotation
Issue Date: 2017
Source: Zhang, M., Zhang, W., Liu, A. Q., Li, F. C., & Lan, C. F. (2017). Tunable Polarization Conversion and Rotation based on a Reconfigurable Metasurface. Scientific Reports, 7(1),12068-. doi: 10.1038/s41598-017-11953-z
Series/Report no.: Scientific Reports
Abstract: Polarization is an important property of electromagnetic (EM) wave and different polarization manipulations are required for varied optical applications. Here we report a reconfigurable metasurface which achieves both the polarization conversion and the polarization rotation in THz regime. The metasurface is reconfigured through the micro-electro-mechanical-systems (MEMS) actuation. The cross polarization transmittance from a linear polarized incidence is experimentally tuned from 0 to 28% at 2.66 THz. In addition, the polarization rotation angle is effectively changed from −12.8° to 13.1° at 1.78 THz. The tunable bi-functional metasurface for polarization conversion and the polarization rotation can be flexibly applied in various applications such as imaging, polarization microscopy and material analysis, etc.
URI: https://hdl.handle.net/10356/88286
http://hdl.handle.net/10220/45725
ISSN: 2045-2322
DOI: 10.1038/s41598-017-11953-z
Rights: © 2017 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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