Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/91312
Title: Multiple regression models for electronic product success prediction
Authors: Lo, Frank Cheong Wah
Foo, Say Wei
Bauly, John A.
Issue Date: 2000
Source: Lo, F.C.W., Foo, S.W. & Bauly, J.A. (2000). Multiple regression models for electronic product success prediction. IEEE International Conference on Management of Innovation and Technology 2000: (pp. 419-422). Singapore: Singapore Polytechnic.
Abstract: As the cost of failure in new product development is very high, product developers are looking for good product success/failure prediction models. The general direction of search is towards Knowledge Based Systems (KBS) that incorporate the wisdom of experienced developers and extracts from data of past projects. In this paper, results of investigation using multiple regression models are reported. It is found that 90% accuracy may be achieved in success/failure prediction of electronic product development using a multiple regression model based on six critical factors.
URI: https://hdl.handle.net/10356/91312
http://hdl.handle.net/10220/4587
DOI: http://dx.doi.org/10.1109/ICMIT.2000.917374
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