Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/88935
Title: Optical study and experimental realization of nanostructured back reflectors with reduced parasitic losses for silicon thin film solar cells
Authors: Li, Zeyu
E, Rusli
Lu, Chenjin
Prakoso, Ari Bimo
Foldyna, Martin
Khoury, Rasha
Bulkin, Pavel
Wang, Junkang
Chen, Wanghua
Johnson, Erik
Cabarrocas, Pere i Roca
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Silicon Thin Film
Light Trapping
Issue Date: 2018
Source: Li, Z., E, R., Lu, C., Prakoso, A. B., Foldyna, M., Khoury, R., . . . Cabarrocas, P. (2018). Optical Study and Experimental Realization of Nanostructured Back Reflectors with Reduced Parasitic Losses for Silicon Thin Film Solar Cells. Nanomaterials, 8(8), 626-. doi:10.3390/nano8080626
Series/Report no.: Nanomaterials
Abstract: We study light trapping and parasitic losses in hydrogenated amorphous silicon thin film solar cells fabricated by plasma-enhanced chemical vapor deposition on nanostructured back reflectors. The back reflectors are patterned using polystyrene assisted lithography. By using O2 plasma etching of the polystyrene spheres, we managed to fabricate hexagonal nanostructured back reflectors. With the help of rigorous modeling, we study the parasitic losses in different back reflectors, non-active layers, and last but not least the light enhancement effect in the silicon absorber layer. Moreover, simulation results have been checked against experimental data. We have demonstrated hexagonal nanostructured amorphous silicon thin film solar cells with a power conversion efficiency of 7.7% and around 34.7% enhancement of the short-circuit current density, compared with planar amorphous silicon thin film solar cells.
URI: https://hdl.handle.net/10356/88935
http://hdl.handle.net/10220/46038
ISSN: 2079-4991
DOI: 10.3390/nano8080626
Rights: © 2018 by The Author(s). Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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