Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/91224
Title: Application of Wigner–Ville distribution in electromigration noise analysis
Authors: Tan, Cher Ming
Lim, Shin Yeh
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2002
Source: Tan, C. M., & Lim, S. Y. (2002). Application of Wigner-Ville distribution in electromigration noise analysis. IEEE Transactions on Device and Materials Reliability, 2(2), 30-35.
Series/Report no.: IEEE transactions on device and materials reliability
Abstract: Electromigration noise analysis has shown great potential for the nondestructive evaluation of electromigration performance of metal stripe. However, contradictive conclusions have been published from the electromigration noise analysis. These contradictive conclusions mainly stem from the complex dynamics of the atomic movement during electromigration, rendering the electromigration noise as a nonstationary signal, and, hence, the standard Fourier transform is not adequate. Among the various nonstationary signal analysis tools,Wigner–Ville distribution is used for the analysis of electromigration noise data for the first time. It is found that much “hidden” and useful information in the noise data can be revealed by using this distribution. These information will enable us to “see” the dynamic of the atomic movement during electromigration, enhancing our understanding of electromigration processes.
URI: https://hdl.handle.net/10356/91224
http://hdl.handle.net/10220/4655
ISSN: 1530-4388
DOI: 10.1109/TDMR.2002.802114
Rights: © 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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