Analysis of nonideal effects on a tomography-based switched-capacitor transducer
Chan, Pak Kwong
Date of Issue2007
School of Electrical and Electronic Engineering
This paper presents a nonideal analysis of a fully-integrated switched-capacitor capacitive transducer for electrical capacitance tomography system. The investigation establishes different types of error source models as well as practical mismatch effects in the derivation of second-order analytical expressions. The analyses are conducted on the basis of heavy stray capacitances of 150 pF typically, in the context of a minimum detection capacitance ranging from 1 to 10 fF. The predicted results agree very well with the HSPICE simulation results using Level 49 BSIM3 models of AMS 0.6- m CMOS process technology with a single 5-V supply. The conservative simulation results have shown that the capacitive transducer differential output displays a baseline dc offset of 0.083mV at 25 C, a change in baseline capacitance of 1 fF from 25 to 40 C and an output temperature coefficient of 0.045 mV/ C from 25 to 100 C at the measuring capacitance of 1 pF. Both the predicted and simulated results presented here are better than that of the reported works.
IEEE sensors journal
© 2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site.