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|Title:||A comparison study of denoising techniques in fringe pattern analysis||Authors:||Zhao, Ming
|Keywords:||DRNTU::Engineering::Computer science and engineering
|Issue Date:||2015||Source:||Zhao, M., & Qian, K. (2015). A comparison study of denoising techniques in fringe pattern analysis. Proceedings of SPIE - International Conference on Experimental Mechanics 2014, 9302, 930208-. doi:10.1117/12.2084795||Abstract:||Optical interferometry is a popular technique for high precision measurement. It produces fringe patterns for analysis. The output fringe patterns usually have noises, and thus a filtering process for fringe patterns is necessary. A few filtering algorithms, such as windowed Fourier filtering (WFF), have been proposed specially for fringe pattern denoising. Meanwhile, filtering techniques have been intensively studied for a long time in the general image processing area. It is curious that how the filtering techniques in general image processing area perform on fringe pattern denoising. In this paper, a state-of-the-art filtering algorithm, block-matching 3D filtering (BM3D), is selected and compared with the WFF.||URI:||https://hdl.handle.net/10356/88190
|DOI:||http://dx.doi.org/10.1117/12.2084795||Rights:||© 2015 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - International Conference on Experimental Mechanics 2014 and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/12.2084795]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||metadata.item.grantfulltext:||open||metadata.item.fulltext:||With Fulltext|
|Appears in Collections:||SCSE Conference Papers|
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